| ??? 03/10/12 13:12 Read: times |
#186553 - Working on that Responding to: ???'s previous message |
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why only use a span of 1V of your ADC? ****************** you already gave answer Because of non-linear components My qus. is: what is outcomes if i will not use full dynamic range? But I will try to increase DC level upto 1.36 V and check it ************ if you measure many samples of the input signal for a number of full periods ************ At present state. this is my main and important task: how to take samples? check zero cross over and A) Every 20mS/1023 = 19uS B) Delay of 4.8ms and take between 4.8mS - 5.2mS (same excercise on negative cycle) C) i am thinking ...... **************** This will of course not be true if there are non-symmetric distortion on the signal **************** this is also a main issues for that proper sampling is require.. i am looking for that only ********** have you tried to perform the ADC measurements in the background, ********** is it possible in MCU? how to use adc measurement in background. i have to check in my MCU. My ADC Spec: Dyanemic Range: 0 to 3.3v Conversion Time: 2.5 uS Resolusion: 8/10/12Bit ************ You talk about zero-crossing detection. But you don't have a zero - ************ I will check Zero crossing before DC level Adding for Refernce so we can know at which place i can take SAMPLES. ************ Do you see any issues getting that code to produce real measurements of the intended quality? ************ Yes, I am facing real time measurement issues. i have already mentioned How and When measure sample? for Perfectly Measurement of Vrms and Irms???? Thank You for your time Mr.Per Westermark it is very useful for me....... Please share your experience so i can comeout from this probelm once again thank you... |
