| ??? 11/30/12 18:24 Read: times |
#188927 - Tell me about it! Responding to: ???'s previous message |
Richard Erlacher said:
Failure modes under out-of-spec conditions have to be identified and characterized. You have to be able to predict what will happen when the device is "abused" in the sense that its environment/power supply/etc. are outside the specified limits. It's difficult and costly, and, in fact, difficult to identify which effects are due to which failure modes. I've just spent the best part of a year working in a major semiconductor manufacturer doing just this kind of characterisation on new silicon. A test "sweeping" whole sets of parameters over all cominations over all their ranges could take days or weeks per chip - and then analysing all the resulting data was another mamoth task! It would be "nice" if, whenever such limitations are exceeded, the device simply stopped, but that's seldom what happens. Indeed! |
