| ??? 06/08/10 08:41 Read: times |
#176514 - "Design For Test" (DFT) Responding to: ???'s previous message |
Google it.
Probably something in your ISO9000 documentation should specify your standard policies & practices for "Design For Test"; eg, "a test-point on every node", ability to disable outputs so that the tester can apply stimuli, etc,... Part of "Production Engineering"... Nowadays, JTAG/Boundary Scan can be used to do (some) testing without needing any involvement from the microcontroller itself... |
| Topic | Author | Date |
| test the test jig | 01/01/70 00:00 | |
| only ISO believes ... | 01/01/70 00:00 | |
| "Calibration" | 01/01/70 00:00 | |
| ISO9000, concepts and lies | 01/01/70 00:00 | |
| doghouse and flagpole | 01/01/70 00:00 | |
| I agree... | 01/01/70 00:00 | |
| Use loopback and stimuli | 01/01/70 00:00 | |
| "Design For Test" (DFT) | 01/01/70 00:00 | |
| You can not ask us | 01/01/70 00:00 | |
| Yes but... | 01/01/70 00:00 | |
| No silver bullet | 01/01/70 00:00 | |
| Calibrations... NIST traceability.... fun | 01/01/70 00:00 | |
| That is what traceable means | 01/01/70 00:00 | |
| Should be few steps to a national reference | 01/01/70 00:00 | |
| Article on the topic | 01/01/70 00:00 | |
Test the test harness | 01/01/70 00:00 |